本人自10多年前在欧美留学工作开始,即一直从事先进互补型金属-氧化物-半导体(CMOS)集成电路相关的研究,包括器件可靠性电路测试,超快速电路的设计与测试、微能源芯片。
博士阶段“微能源集成芯片”给物联网中的无线网传感器进行自供电充电,效率比传统的自供电系统高100倍;该工作先后被80家网络媒体报道,5家纸媒报道,其中包括荷兰国内最大的报纸。其相关的后续的改进技术已经申请国内专利。
在美国国家标准局主导研发的“快速测试电路测试系统”打破了当时的器件电学性能测试速度的世界记录,第一次得到器件在真实CPU中工作状态的电学特性参数。其相关的后续的改进技术已经在国内获得专利,目前正在国内进行了成果产业化转化。
到目前发表业界顶级学术论文30余篇,其中SCI/EI收录20余篇;多次在国际电子器件领域的国际顶级会议IEEE International Electron Devices Meeting(IEDM)、IEEE VLSI Symposia报告研究成果。
J. Lu, W. Liu, d. W. Van, C. H. M, A. Y. Kovalgin, Y. Sun, R. E. I. Schropp, J. Schmitz*, Above-CMOS a-Si and CIGS solar cells for powering autonomous microsystems, IEEE Electron Devices Meeting, U.S.A, San Francisco, 2010,12.02~12.05
J. W. Lu, C. Vaz, J. P. Campbell, and J. T. Ryan, "Device-level PBTI-induced timing jitter increase in circuit-speed random logic operation," IEEE VlSI Technology, 2014, pp. 1-2.
Yanyan Zhang, Ran Cheng, Dong Yi, Jiwu Lu*, Yi Zhao,“Thermal Conductivity Characterization of Ultra-thin Silicon Film Using Ultra-fast Transient Hot Strip Method” Chinese Physics B,2019,(accepted, RefNo. 190469)
J. Liu, M. Shi, J. Lu*, and M. P. Anantram, "Analysis of electrical-field-dependent Dzyaloshinskii-Moriya interaction and magnetocrystalline anisotropy in a two-dimensional ferromagnetic monolayer," Physical Review B, vol. 97, p. 054416, 02/16/ 2018
J. B. Sun and J. W. Lu*, "Interface Engineering and Gate Dielectric Engineering for High Performance Ge MOSFETs," Advances in Condensed Matter Physics, p. 9, 2015
J. Lu, G. Jiao, C. Vaz, and J. P. Campbell, "PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic," IEEE Transactions on Electron Devices, vol. 61, pp. 3613-3618, 2014.
G. F. Jiao#, J. W. Lu#, J. P. Campbell, and J. T. Ryan, "Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter," Device & Materials Reliability IEEE Transactions on, vol. 14, pp. 972-977, 2014. (#co-first author)
J. Lu#, W. Liu, A. Y. Kovalgin, Y. Sun and J. Schmitz*, "Integration of Solar Cells on Top of CMOS Chips—Part II: CIGS Solar Cells," IEEE Transactions on Electron Devices, 2011, 58(8):2620-2627
J. Lu#,, A. Y. Kovalgin, K. H. M. V. D. Werf, R. E. I. Schropp and J. Schmitz*, Integration of Solar Cells on Top of CMOS Chips Part I: a-Si Solar Cells, IEEE Transactions on Electron Devices, 2011, 58(7): 2014-2021.
G. F. Jiao#, J. W. Lu#, J. P. Campbell, J. T. Ryan, K. P. Cheung, C. D. Young, Bersuker, G, "Circuit speed timing jitter increase in random logic operation after NBTI stress," IEEE International Reliability Physics Symposium, 2014, pp. 6B.1.1-6B.1.4(#co-first author)
本人在国外就与恩智浦(NXP),英特尔(Intel)、三星(Samsung)、台积电(TSMC)展开过科研合作;在中国与集成电路的领军企业中芯国际(SMIC)展开合作,并与其CEO邱慈云、执行副总裁李序武有过深入沟通;在湖南省与国科微电子等集成电路相关企业展开了深度合作。具体如下: